SEM-IRIS System: In situ correlative OM-EM

Partnership with O.N.E.R.A. lab. (Denis BOIVIN, Yves RENOLLET-CHATILLON France)
Logo Onera

NewTec has introduced a new concept into correlative microscopy, by fitting inside an optical microscope inside SEM chamber, image coincidence is then coaxial by construction.

No sample movements, no complex 3 points re-alignment on fiducial markers. Image repositioning is always below optical pixel size thanks to mechanical design, infinite swap from OM to EM, optional motorized zoom & focus.

System overview
System overview
Macroscopic view
Optical image during a tensile test : macroscopic view of the sample
Nanoscopic view
SEM image during the same tensile test : Nanoscopic view at the center of the sample
System overview
NewTec introduce another way of exploring your samples
SEM IN – Optic OFF
SEM IN – Optic OFF
SEM Image
SEM Off - Optic IN
SEM Off - Optic IN
Optical image