SEM-IRIS System: In situ correlative OM-EMPartnership with O.N.E.R.A. lab. (Denis BOIVIN, Yves RENOLLET-CHATILLON France)
NewTec has introduced a new concept into correlative microscopy, by fitting inside an optical microscope inside SEM chamber, image coincidence is then coaxial by construction.
No sample movements, no complex 3 points re-alignment on fiducial markers. Image repositioning is always below optical pixel size thanks to mechanical design, infinite swap from OM to EM, optional motorized zoom & focus.